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Albert (Hong) Wang

Albert entered the University of Akron in 1990 and received his M.S. degree in Physics in 1992. His research involved characterization of thin metal films grown epitaxially by thermal evaporation onto either HOPG graphite or mica. During his tenure in Physics, Albert mastered an understanding of data acquisition systems, electronic feedback, and became an expert in data analysis and interpretation of STM/AFM images. He and his wife Jing Jing co-authored 5 publications in refereed journals. Mr. Wang joined Park Scientific Instrument as an applications engineer in 1994. At PSI he is an experienced ambient SPM specialist and is responsible for all applications in the area of materials science. He developed a special force modulation application that resulted in a product: Material Analyses Package (MAP). Albert’s specialties are: Force Modulation and Phase Imaging, Magnetic Force Microscopy (MFM), and Electro-static Force Microscopy (EFM). Albert’s hobbies are tennis and soccer.

To learn more about PSI, click Park Scientific Instruments.

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