Jason Lohr
Jason entered the physics program at the University of Akron in 1989, earning
the B.S. in 1993 and the M.S. in 1995. His graduate research involved the
epitaxial growth of thin bismuth films. In 1995, Jason's experience in
scanning probe microscopy earned him a position with Advanced Surface Microscopy
(ASM), Inc. in Indianapolis. As an Analytical Scientist, his primary responsibility
involved analyzing a varied assortment of client samples using several
SPM techniques, including magnetic force and chemical mapping. At ASM he
wrote software enhancement packages for use with scanning probe microscopes,
such as their Calibrator Pro and DiscTrack measurement software. Earlier
this year, some of his work contributed to the issuance of ASM's first
patent, of which he was co-developer. Dozens of patent claims to which
he contributed are still pending. He also has co-authored or contributed
to several papers presented at technical meetings such as Scanning '96
and AVS '96. As a result of Jason's experience with patent applications
he has decided to become a patent attorney and will commence studies this
fall at Capitol University School of Law in Columbus, OH. Jason's skills
at HTML programming can be viewed at "http://www.a1.com/asm/".
"I feel that the strong, hands-on experience that I received at the
University of Akron really gave me the preparation I needed to succeed
in today's job market. From the laser spectrometry, circuitry, and programming
that I worked on in Advanced Lab to the high-vacuum film growth and scanning
probe microscopy that encompassed my graduate work, everything that I worked
with in lab has benefited me in my current position. We serve clients in
several industries, including semiconductors, data storage, and integrated
circuits. The knowledge I gained at The University of Akron gave me the
ability to have intelligent conversations with our technical contacts and
take logical steps to help solve their material problems."
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